Position: Research
Associate
Office: Earl Mountbatten Building G.02
Telephone: +44 (0) 131 451 3086
Email:
k.a.serrels@hw.ac.uk
Biography
Dr Keith A. Serrels obtained his MPhys (Hons) in
Optoelectronics and Laser Engineering from Heriot-Watt
University, Edinburgh, Scotland in 2005 and his PhD
in Ultra-High Resolution Nonlinear Solid Immersion
Microscopy of Silicon Integrated-Circuits (ICs) in
Prof. Derryck Reid’s Ultrafast Optics Group at
Heriot-Watt University in 2009. As part of his PhD
research effort, he demonstrated a number of record
breaking resolution-enhancing techniques and
reported the first time-domain optical coherence
tomography (OCT) imaging system for the purpose of
non-destructive investigation of silicon ICs. His
current research interests include semiconductor
integrated-circuit characterisation and debug, solid
immersion lens applications, optical
super-resolution techniques, OCT and the development
of high-power diode laser sources for industrial
applications.Publications
Journal Publications
-
K. A. Serrels, M.K. Renner and D. T. Reid,
Optical coherence tomography for non-destructive
investigation of silicon integrated-circuits,
Microelectronic Engineering 87, 1785-1791(2009)
-
K. A. Serrels, E. Ramsay and D. T. Reid, 70nm
resolution in sub-surface optical beam induced
current microscopy through pupil-function
engineering in the vectorial-focusing regime,
Applied Physics Letters, 94, 073113 (2009)
-
K. A. Serrels, E. Ramsay, P. A. Dalgarno, B. D.
Gerardot, J. A. O’Conner, R. H. Hadfield, R. J.
Warburton and D. T. Reid, Solid immersion lens
applications for nanophotonic devices, Journal
of Nanophotonics, 2, 021854 (2008)
-
K. A. Serrels, E. Ramsay, R. J. Warburton and D.
T. Reid, Nanoscale optical microscopy in the
vectorial focusing regime, Nature Photonics 2,
311-314 (2008)
-
E. Ramsay, K. A. Serrels, A. J. Waddie, M. R.
Taghizadeh, and D. T. Reid, Optical
super-resolution with aperture-function
engineering, American Journal of Physics, 76,
1002 (2008)
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, M. R. Taghizadeh, R. J. Warburton and D.
T. Reid, Three-dimensional nanoscale subsurface
optical imaging of silicon circuits, Applied
Physics Letters 90, 131101 (2007)
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Three-dimensional nanometric
sub-surface imaging of a silicon flip-chip using
the two-photon optical beam induced current
method, Microelectronics Reliability 47,
1534-1538 (2007)
International and Full Length Conference
Papers
-
K. A. Serrels, E. Ramsay and D. T. Reid, 70nm
Resolution in Sub-Surface Two-Photon Optical
Beam Induced Current Microscopy through
Pupil-Function Engineering in the Vectorial
Focusing Regime, International Quantum
Electronics Conference (IQEC), Baltimore, MA,
United States, 2009
-
K. A. Serrels, E. Ramsay, R. J. Warburton and D.
T. Reid, Nanoscale Optical Microscopy in the
Vectorial Focusing Regime, Photon 08, Heriot-Watt
University, Edinburgh, Scotland, 2008
-
K.A. Serrels, E. Ramsay, R.J. Warburton, and D.T.
Reid, Nanoscale microscopy of silicon integrated
circuits, LPHYS08, Trondheim, Norway, 2008
-
K. A. Serrels, E. Ramsay, R. J. Warburton and D.
T. Reid, Nanoscale Optical Microscopy in the
Vectorial Focusing Regime, Quantum Electronics
and Lasers (QELS), San Jose, CA, United States,
2008
-
K. A. Serrels, E. Ramsay, R. J. Warburton and D.
T. Reid, Nanoscale Optical Microscopy in the
Vectorial Focusing Regime, International
Conference on Ultrafast Phenomena (UP2008),
Stresa, Lago Maggiore, Italy, 2008
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Three-dimensional nanometric
sub-surface imaging of a silicon flip-chip using
the two-photon optical beam induced current
method, International Symposium for Testing and
Failure Analysis (ISTFA), San Jose, CA, United
States, 2007
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Three-dimensional nanometric
sub-surface imaging of a silicon flip-chip using
the two-photon optical beam induced current
method, European Symposium Reliability of
Electron Devices, Failure Physics and Analysis (ESREF),
Bordeau, France, 2007
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Three-dimensional nanometric
sub-surface imaging of a silicon flip-chip using
the two-photon optical beam induced current
method, Conference on Lasers and Electro-Optics
Europe (ECLEO), Munich, Germany, 2007
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Nanometric Three-Dimensional
Sub-Surface Imaging of a Silicon Flip-Chip,
Conference on Lasers and Electro-Optics (CLEO),
Baltimore, Maryland, United States, 2007
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Nanometric Three-Dimensional
Sub-Surface Imaging of a Silicon Flip-Chip,
European Optical Society (EOS) Annual Meeting
2006, Paris, France, 2006
-
E. Ramsay, K. A. Serrels, M. J. Thomson, A. J.
Waddie, R. J. Warburton, M. R. Taghizadeh and D.
T. Reid, Ultra-high Resolution,
Three-Dimensional, Solid-Immersion Imaging of a
Silicon Flip-Chip using the Optical-Beam Induced
Current Method, Photon 06, Manchester
University, England, 2006
|
